The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2005

Filed:

Dec. 22, 2003
Applicants:

Sarah E. Kim, Portland, OR (US);

Kevin J. Lee, Beaverton, OR (US);

Anna M. George, Sunnyvale, CA (US);

Inventors:

Sarah E. Kim, Portland, OR (US);

Kevin J. Lee, Beaverton, OR (US);

Anna M. George, Sunnyvale, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L023/48 ;
U.S. Cl.
CPC ...
Abstract

A process flow to make an interconnect structure with one or more thick metal layers under Controlled Collapse Chip Connection (C4) bumps at a die or wafer level. The interconnect structure may be used in a backend interconnect of a microprocessor. The process flow may include forming an inter-layer dielectric with spray coating or lamination over a surface with high aspect ratio structures.


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Kim, Sarah. (2005). Methods of processing thick ild layers using spray coating or lamination for c4 wafer level thick metal integrated flow (U.S. Patent No. 6943440). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6943440

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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