The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6928638 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 09, 2005

Filed:

Aug. 07, 2001
Applicants:

Praveen K. Parvathala, Phoenix, AZ (US);

Kailasnath Maneparambil, Chandler, AZ (US);

William C. Lindsay, Chandler, AZ (US);

Kamalnayan Jayaraman, Chandler, AZ (US);

Geliang Zhou, Santa Cara, CA (US);

Inventors:

Praveen K. Parvathala, Phoenix, AZ (US);

Kailasnath Maneparambil, Chandler, AZ (US);

William C. Lindsay, Chandler, AZ (US);

Kamalnayan Jayaraman, Chandler, AZ (US);

Geliang Zhou, Santa Cara, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F009/44 ;
U.S. Cl.
CPC ...
Abstract

A host system for generating a software built-in self-test engine (SBE) is provided for enabling on-chip generation and application of a re-generative functional test on a complex device such as a microprocessor under test. The host system comprises user directives provided to indicate user desired actions; instruction information provided to define a suite of instructions; and a SBE generation tool arranged to generate a software built-in self-test engine (SBE) based on the user directives, the instruction information and device constraints, for subsequent storage on-board of a complex device such as a microprocessor under test and activation of a re-generative functional test on the complex device under test (DUT).


Find Patent Forward Citations

Parvathala, Praveen. (2005). Tool for generating a re-generative functional test (U.S. Patent No. 6928638). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6928638

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