The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2005
Filed:
Feb. 26, 2003
Benjamin A. Ward, Portland, OR (US);
John J. Pickerd, Beaverton, OR (US);
Benjamin A. Ward, Portland, OR (US);
John J. Pickerd, Beaverton, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A test and measurement instrument acquires a signal from a device under test, displays that signal as a source waveform, and makes measurements on that source waveform with regard to a predetermined property or event. The test and measurement instrument employs the method of the subject invention for placing these measurements into a waveform and directly correlating a position in the measurement waveform to the same area on the source waveform where they were measured. Specifically, the subject invention displays the correlation of points on a source waveform and a measurement waveform without requiring the use of a common horizontal time scale. In one embodiment of the invention, the measurement waveform is a histogram and a pointer to a given location in the histogram causes identification of corresponding areas in the source waveform.