The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2005
Filed:
Apr. 02, 2001
Alexander J. Pasadyn, Austin, TX (US);
Joyce S. Oey Hewett, Austin, TX (US);
Christopher A. Bode, Austin, TX (US);
Anthony J. Toprac, Austin, TX (US);
Anastasia Oshelski Peterson, Austin, TX (US);
Thomas J. Sonderman, Austin, TX (US);
Michael L. Miller, Cedar Park, TX (US);
Alexander J. Pasadyn, Austin, TX (US);
Joyce S. Oey Hewett, Austin, TX (US);
Christopher A. Bode, Austin, TX (US);
Anthony J. Toprac, Austin, TX (US);
Anastasia Oshelski Peterson, Austin, TX (US);
Thomas J. Sonderman, Austin, TX (US);
Michael L. Miller, Cedar Park, TX (US);
Advanced Micro Devices, Inc., Austin, TX (US);
Abstract
A method for distinguishing between sources of process variation includes processing a plurality of manufactured items in a process flow; storing a set of production environment data associated with each of the manufactured items; identifying manufactured items associated with a process drift; generating a plurality of characteristic threads based on the production environment data; comparing the characteristic threads for at least those manufactured items associated with the process drift; and determining at least one potential cause for the process drift based on the comparison of the characteristic threads. A manufacturing system for distinguishing between sources of process variation is also provided. The manufacturing system includes a plurality of tools for processing manufactured items in a process flow, a database server, and a drift monitor.