The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2005
Filed:
Apr. 30, 2002
Srikanteswara Dakshina-murthy, Austin, TX (US);
Douglas J. Bonser, Austin, TX (US);
Karen Turnquest, Pflugerville, TX (US);
Srikanteswara Dakshina-Murthy, Austin, TX (US);
Douglas J. Bonser, Austin, TX (US);
Karen Turnquest, Pflugerville, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method for forming semiconductor features, e.g., gates, line widths, thicknesses and spaces, produced by a photoresist trim procedure, in a closed loop process is presented. The methodology enables the use of optical emission spectroscopy and/or optical interferometry techniques for endpoint monitoring during resist trim etching of photoresist structures. Various types of material layers underlying photoresist structures are employed in order to provide an endpoint signal to enable closed loop control, with resultant improved targeting of photoresist mask and reproducibility. In addition, the method provides for in situ etch rate monitoring, and is not adversely affected by etch rate variances within an etching chamber during an etch process.