The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2005

Filed:

Apr. 19, 2002
Applicants:

Karsten Wieczorek, Boxdorf, DE;

Stephan Krügel, Boxdorf, DE;

Falk Graetsch, Dresden, DE;

Inventors:

Karsten Wieczorek, Boxdorf, DE;

Stephan Krügel, Boxdorf, DE;

Falk Graetsch, Dresden, DE;

Assignee:

Advanced Micro Devices, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L021/8238 ;
U.S. Cl.
CPC ...
Abstract

A method for forming a reliable and ultra-thin oxide layer, such as a gate oxide layer of an MOS transistor, comprises an annealing step immediately performed prior to oxidizing a substrate. The annealing step is performed in an inert gas ambient to avoid oxidation of the semiconductor surface prior to achieving a required low oxidizing temperature. Preferably, the annealing step and the oxidizing step are carried out as an in situ process, thereby minimizing the thermal budget of the overall process.


Find Patent Forward Citations

Loading…