The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2005

Filed:

Sep. 10, 2003
Applicants:

Seiichiro Kanno, Chiyoda, JP;

Ken Yoshioka, Hikari, JP;

Ryoji Nishio, Kudamatsu, JP;

Saburou Kanai, Hikari, JP;

Hideki Kihara, Kudamatsu, JP;

Koji Okuda, Kudamatsu, JP;

Inventors:

Seiichiro Kanno, Chiyoda, JP;

Ken Yoshioka, Hikari, JP;

Ryoji Nishio, Kudamatsu, JP;

Saburou Kanai, Hikari, JP;

Hideki Kihara, Kudamatsu, JP;

Koji Okuda, Kudamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F26B019/00 ;
U.S. Cl.
CPC ...
Abstract

A wafer stage for use in a wafer processing apparatus having a liquid cooling jacket with a built-in coolant liquid circulation path and a ceramic plate as attached onto the liquid cooling jacket and having therein a heater and an electrode for an electrostatic chuck. The wafer stage enables performance of wafer processing while letting a wafer be mounted on the ceramic plate. The liquid cooling jacket enables attachment of the ceramic plate through a gap for circulation of a coolant gas as formed over the liquid cooling jacket, and a heat resistant seal material containing therein an elastic body for sealing the coolant gas between the liquid cooling jacket and the ceramic plate.


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