The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2005
Filed:
Mar. 05, 2002
Michael Gerhard, Aalen, DE;
Frank-thomas Lentes, Bingen, DE;
Christian Kusch, Jena, DE;
Wolfgang Singer, Aalen, DE;
Ewald Moersen, Mainz, DE;
Michael Gerhard, Aalen, DE;
Frank-Thomas Lentes, Bingen, DE;
Christian Kusch, Jena, DE;
Wolfgang Singer, Aalen, DE;
Ewald Moersen, Mainz, DE;
Schott Glas, Mainz, DE;
Carl Zeiss SMT AG, Oberkochen, DE;
Abstract
The method for evaluating schlieren in glassy or crystalline optical materials includes irradiating a test sample of the optical material with light and producing a shadow image of the test sample on a projection screen. The shadow image of the test sample is received in an electronic image receiving device, such as a digital camera, and is compared with another shadow image of schlieren obtained with a comparison sample by means of interferometry. Then the optical material of the test sample is evaluated with the help of the comparison results.