The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2005
Filed:
Jul. 31, 2003
Joseph C. Fjelstad, Maple Valley, CA (US);
Belgacem Haba, Cupertino, CA (US);
Joseph C. Fjelstad, Maple Valley, CA (US);
Belgacem Haba, Cupertino, CA (US);
Silicon Pipe, Inc., San Jose, CA (US);
Abstract
A multilayered circuit component includes one or more substrates. A first surface of one of the substrates includes circuit paths and other current carrying elements. A second surface of the same or another substrate also includes circuit paths and other current carrying elements. An aperture extends through at least a portion of the one or more substrates. The aperture is defined by a first opening on the first surface, a second opening on the second surface, and an internal surface of the one or more substrates that extends between the first surface and the second surface. A first trace element is provided over a portion of the internal surface of the aperture to extend between the first surface and the second surface. The first trace element extends onto the first surface to form a first partial perimeter of the first opening. A second trace element is provided over a portion of the internal surface of the aperture to extend between the first surface and the second surface. The second trace element extends onto the first surface to form a second partial perimeter of the first opening.