The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2005
Filed:
Jan. 21, 2003
Applicants:
Scott Josef Bukofsky, Hopewell Junction, NY (US);
Bomy Able Chen, Cupertino, CA (US);
Sara Jennifer Eames, Austin, TX (US);
Qiang Wu, Poughkeepsie, NY (US);
Inventors:
Scott Josef Bukofsky, Hopewell Junction, NY (US);
Bomy Able Chen, Cupertino, CA (US);
Sara Jennifer Eames, Austin, TX (US);
Qiang Wu, Poughkeepsie, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J037/30 ; H01J029/70 ; H01J029/72 ;
U.S. Cl.
CPC ...
Abstract
An e-beam system generates a set of massively parallel beams of order of magnitude 1,000 by employing a flash eprom to store calibration data and to receive on/off signals directed through the address system of the memory array, the individual electron sources being mounted above the memory array in a geometric array that tracks the structure of the memory array.