The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2005

Filed:

May. 14, 2003
Applicants:

Kuang-chao Chen, Hsinchu, TW;

Hsueh-hao Shih, Hsinchu, TW;

Ling-wuu Yang, Taichung, TW;

Inventors:

Kuang-Chao Chen, Hsinchu, TW;

Hsueh-Hao Shih, Hsinchu, TW;

Ling-Wuu Yang, Taichung, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L021/336 ;
U.S. Cl.
CPC ...
Abstract

A method of fabricating a flash memory device is provided. First, a substrate partitioned into a memory cell region and a peripheral circuit region is provided. A tunnel dielectric layer is formed over the memory cell region and a liner layer is formed over the peripheral circuit region. Thereafter, a patterned gate conductive layer is formed over the substrate. An inter-gate dielectric layer and a passivation layer are sequentially formed over the substrate. The passivation layer, the inter-gate dielectric layer, the gate conductive layer and the liner layer over the peripheral circuit region are removed. A gate dielectric layer is formed over the peripheral circuit region while the passivation layer over the memory cell region is converted into an oxide layer. Another conductive layer is formed over the substrate. The conductive layer, the oxide layer, the inter-gate dielectric layer and the gate conductive layer over the memory cell region are patterned to form a memory gate. The second conductive layer over the peripheral circuit region is similarly patterned to form a gate.


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