The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2005

Filed:

Apr. 10, 2003
Applicant:

Bruce Luttrell, San Jose, CA (US);

Inventor:

Bruce Luttrell, San Jose, CA (US);

Assignee:

Numerical Technologies, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F009/00 ; G03F017/50 ; G06F017/50 ;
U.S. Cl.
CPC ...
Abstract

A system for fracturing polygons on masks used in lithography processes for manufacturing an integrated circuit is described. The system fractures polygons that include cavities in either the horizontal edges or the vertical edges by examining the aspect ratio (length/width) of prospective slices made at each vertex of the polygon. After determining the aspect ratio of each prospective slice, the system selects the slice with the lowest aspect ratio and slices the polygon into two sub-polygons. Slicing the polygon in this manner effectively eliminates 'slivers' or slices with extreme aspect ratios. This process is continued until each sub-polygon is either a rectangle or a trapezoid that can be printed by electron beam photolithography.


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