The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2005
Filed:
Sep. 10, 2002
Thomas Roehr, Kanagawa, JP;
Hans-oliver Joachim, Kanagawa, JP;
Michael Jacob, Kanagawa, JP;
Joerg Wohlfahrt, Kanagawa, JP;
Takashima Daisaburo, Tokyo, JP;
Thomas Roehr, Kanagawa, JP;
Hans-Oliver Joachim, Kanagawa, JP;
Michael Jacob, Kanagawa, JP;
Joerg Wohlfahrt, Kanagawa, JP;
Takashima Daisaburo, Tokyo, JP;
Infineon Technologies Aktiengesellschaft, Munich, DE;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A test circuit for testing differential read signals during a memory access is disclosed. The test circuit is coupled to a pair of bit lines. During a read access, a selected memory cell produces a differential read signal on the bit lines. When the test circuit is activated, the magnitude of the differential read signal is varied. This enables easy testing of read signal margins in, for example, memory ICs.