The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2005

Filed:

Oct. 25, 2002
Applicants:

Andrew E. Feiring, Wilmington, DE (US);

Jerald Feldman, Wilmington, DE (US);

Frank L. Schadt, Iii, Wilmington, DE (US);

Gary Newton Taylor, Northborough, MA (US);

Inventors:

Andrew E. Feiring, Wilmington, DE (US);

Jerald Feldman, Wilmington, DE (US);

Frank L. Schadt, III, Wilmington, DE (US);

Gary Newton Taylor, Northborough, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F007/004 ; C08F214/18 ; C08F010/00 ;
U.S. Cl.
CPC ...
Abstract

Fluorinated polymers, photoresists and associated processes for microlithography are described. These polymers and photoresists are comprised of esters derived from fluoroalcohol functional groups that simultaneously impart high ultraviolet (UV) transparency and developability in basic media to these materials. The materials of this invention have high UV transparency, particularly at short wavelengths, e.g., 157 nm, which makes them highly useful for lithography at these short wavelengths.


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