The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2005
Filed:
Jan. 31, 2003
Franz Cemic, Weilmuenster, DE;
Lambert Danner, Wetzlar-Naunheim, DE;
Robert Mainberger, Braunfels, DE;
Michael Veith, Wetzlar, DE;
Martin Osterfeld, Schlaitdorf, DE;
Uwe Graf, Solms, DE;
Franz Cemic, Weilmuenster, DE;
Lambert Danner, Wetzlar-Naunheim, DE;
Robert Mainberger, Braunfels, DE;
Michael Veith, Wetzlar, DE;
Martin Osterfeld, Schlaitdorf, DE;
Uwe Graf, Solms, DE;
Leica Microsystems Semiconductor GmbH, Wetzlar, DE;
Abstract
An autofocus module for a microscope-based system includes at least two light sources, each of which generates a light beam for focusing. An optical directing device is provided that directs a respective portion of each light beam onto an incoupling means, which couples each of the light beams into the illuminating light beam of the microscope-based system and directs the light beams onto a specimen. A first and a second detector receive the light beams of the first and second light source reflected from the surface of the specimen, and ascertain the intensities on the first and second detector in time-multiplexed fashion.