The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6875701 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 05, 2005

Filed:

Feb. 05, 2002
Applicants:

Michihiko Yanagisawa, Sagamihara, JP;

Tadayoshi Okuya, Yokohama, JP;

Inventors:

Michihiko Yanagisawa, Sagamihara, JP;

Tadayoshi Okuya, Yokohama, JP;

Assignee:

Speedfam Co., Ltd., Kanagawa-Pref., JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L021/302 ;
U.S. Cl.
CPC ...
Abstract

To remove nanotopography (unevenness of wavelength: 0.2 mm through 20 mm, wave height: 1 through several hundreds nm) which has already been produced on a surface of a semiconductor wafer which has been regarded as impossible to remove conventionally, a half value width of an etching profile of activated species gas is set to fall in a range equal to or smaller than a wavelength a of nanotopography and equal to or larger than a half thereof. Based on previously measured data of nanotopography, moving speed and locus of injected activated species gas along a surface of a semiconductor wafer are calculated and controlled.


Find Patent Forward Citations

Yanagisawa, Michihiko. (2005). Nanotopography removing method (U.S. Patent No. 6875701). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6875701

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…