The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2005

Filed:

Nov. 07, 2002
Applicants:

Lih-ping LI, Hsinchu, TW;

Yung-chen LU, Taipei, TW;

Chung-chi Ko, Nantou, TW;

Inventors:

Lih-Ping Li, Hsinchu, TW;

Yung-Chen Lu, Taipei, TW;

Chung-Chi Ko, Nantou, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L021/4763 ; H01L021/26 ;
U.S. Cl.
CPC ...
Abstract

A method of increasing the cracking threshold of a low-k material layer comprising the following steps. A substrate having a low-k material layer formed thereover is provided. The low-k material layer having a cracking threshold. The low-k material layer is plasma treated to increase the low-k material layer cracking threshold. The plasma treatment including a gas that is CO, He, NHor combinations thereof.


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