The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2005
Filed:
Jan. 21, 2003
Steven Alan Cordes, Yorktown Heights, NY (US);
David R. Dimilia, Wappingers Falls, NY (US);
James Patrick Doyle, Bronx, NY (US);
Matthew James Farinelli, Bronx, NY (US);
Snigdha Ghoshal, Austin, TX (US);
Uttam Shyamalindu Ghoshal, Austin, TX (US);
Chandler Todd Mcdowell, Austin, TX (US);
LI Shi, Austin, TX (US);
Steven Alan Cordes, Yorktown Heights, NY (US);
David R. DiMilia, Wappingers Falls, NY (US);
James Patrick Doyle, Bronx, NY (US);
Matthew James Farinelli, Bronx, NY (US);
Snigdha Ghoshal, Austin, TX (US);
Uttam Shyamalindu Ghoshal, Austin, TX (US);
Chandler Todd McDowell, Austin, TX (US);
Li Shi, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.