The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2005
Filed:
Sep. 24, 2002
Ryuji Kohno, Chiyoda, JP;
Hiroya Shimizu, Ryuugasaki, JP;
Masatoshi Kanamaru, Miho, JP;
Atsushi Hosogane, Iwama, JP;
Toshio Miyatake, Chiyoda, JP;
Hideo Miura, Koshigaya, JP;
Tatsuya Nagata, Ishioka, JP;
Yoshishige Endo, Tsuchiura, JP;
Masaaki Namba, Sayama, JP;
Yuji Wada, Tachikawa, JP;
Ryuji Kohno, Chiyoda, JP;
Hiroya Shimizu, Ryuugasaki, JP;
Masatoshi Kanamaru, Miho, JP;
Atsushi Hosogane, Iwama, JP;
Toshio Miyatake, Chiyoda, JP;
Hideo Miura, Koshigaya, JP;
Tatsuya Nagata, Ishioka, JP;
Yoshishige Endo, Tsuchiura, JP;
Masaaki Namba, Sayama, JP;
Yuji Wada, Tachikawa, JP;
Renesas Technology Corp., Tokyo, JP;
Abstract
A packaging device for holding thereon a plurality of semiconductor devices to be inspected on an inspection device including a probe to be electrically connected to an electrode of each of the semiconductor devices, comprises, holes for respectively receiving detachably therein the semiconductor devices to keep a positional relationship among the semiconductor devices and a positional relationship between the packaging device and each of the semiconductor devices constant with a spacing between the semiconductor devices, in a direction perpendicular to a thickness direction of the semiconductor devices, and electrically conductive members adapted to be connected respectively to the electrodes of the semiconductor devices, and extending to an exterior of the packaging device so that the probe is connected to each of the electrically conductive members.