The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6842026 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 11, 2005

Filed:

Nov. 15, 2001
Applicants:

Shuji Yamaoka, Fukuyama, JP;

Shogo Ishioka, Fukayasu-gun, JP;

Inventors:

Shuji Yamaoka, Fukuyama, JP;

Shogo Ishioka, Fukayasu-gun, JP;

Assignee:

OHT, Inc., Fukayasu-gun, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3102 ;
U.S. Cl.
CPC ...
Abstract

The present invention provides an apparatus and method for inspecting a circuit board at a high speed. An LCD driver moduleas an object to be inspected has an onboard LCD driving LSIOne circuit-wiring groupis connected to SEG terminals, and another circuit-wiring groupis connected to COM terminals of the LSIAn inspection apparatusgenerates an LSI drive signal and sends it to input terminalsof the LSIA pair of sensorsare positioned opposedly to the circuit-wiring groupsrespectively, in a non-contact manner. Each of the sensorsdetects voltage changes in the corresponding circuit-wiring groupcaused by driving the LSIand the detected signals are analyzed by the inspection apparatus


Find Patent Forward Citations

Yamaoka, Shuji. (2005). Inspecting apparatus and inspecting method for circuit board (U.S. Patent No. 6842026). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6842026

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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