The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2004

Filed:

Apr. 30, 2003
Applicant:
Inventors:

Hong-Sik Jeong, Kyungki-do, KR;

Ki-Nam Kim, Kyungki-do, KR;

Yoo-Sang Hwang, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1336 ; H01L 2/1425 ; H01L 2/14763 ;
U.S. Cl.
CPC ...
H01L 2/1336 ; H01L 2/1425 ; H01L 2/14763 ;
Abstract

In one embodiment, a plurality of gate structures including gate electrodes and insulating layers covering the gate electrodes are formed on a semiconductor substrate. Impurity ions at a low dose for forming a source/drain region are implanted into the semiconductor substrate, using the gate structures as a mask. First insulating spacers are formed on the sidewalls of the gate structures and second insulating spacers are formed on the first insulating spacers. Thereafter, impurity ions at a high dose are implanted into the semiconductor substrate, using the first and second insulating spacers as a mask. Then, the second insulating spacers are removed. Therefore, contact resistance and characteristics of the transistors can be improved by adjusting an effective channel length and contact areas.


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