The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2004
Filed:
Mar. 19, 2001
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
The present invention makes it possible to obtain an aging deterioration margin amount including an allowance for aging deterioration in a simplified manner. Moreover, in order to allow an appropriate inspection taking aging deterioration into account, a delay deterioration rate predicting part outputs signal path delay information before deterioration and signal path delay deterioration rate information for each signal path, based on LSI design information . A delay vs. delay deterioration rate analyzing part outputs delay vs. delay deterioration rate relationship information showing the correlation between the delay and the delay deterioration rate based on the information. A delay deterioration rate extracting part extracts a delay deterioration rate of a predetermined signal path and outputs it as delay deterioration margin . A delay deterioration margin amount calculating part calculates a delay deterioration margin amount by using the delay deterioration margin as a derating factor G. Furthermore, a inspection operation frequency calculating part calculates an operation frequency for inspection using the delay deterioration margin as a derating factor G.