The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2004
Filed:
Sep. 24, 2002
Rochit Rajsuman, Santa Clara, CA (US);
Hiroaki Yamoto, Santa Clara, CA (US);
Advantest Corp., Tokyo, JP;
Abstract
A high speed semiconductor test system is so designed that pin cards in a test head are arranged in radial directions where the DUT is placed over the center of the test head. Since each of the pin cards is arranged radially, the side which faces the center is close to the DUT, and time critical components in the pin card are formed in an area close to the side of that faces the center, thereby minimizing the round-trip-delay (RTD).Moreover, each pin card is distanced equally from the DUT. Thus, the variation in the length of path connecting between the pin card and the DUT is minimized, and accordingly, the variation in RTD is also minimized.