The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2004

Filed:

Oct. 17, 2002
Applicant:
Inventors:

Christian Wagner, Eersel, NL;

Wilhelm Ulrich, Aalen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 9/00 ; G02B 1/314 ; G03B 2/754 ; F21V 2/700 ;
U.S. Cl.
CPC ...
G02B 9/00 ; G02B 1/314 ; G03B 2/754 ; F21V 2/700 ;
Abstract

The invention relates to a projection exposure apparatus for microlithography at &lgr;<200 nm. The projection exposure apparatus for microlithography has a light source with a wavelength less than 200 nm and a bandwidth, which is less than 0.3 pm, preferably less than 0.25 pm and greater than 0.1 pm. The projection exposure apparatus includes an exclusively refractive projection objective which is made out of a single lens material. The projection objective provides for a maximum image height in the range of 12 mm to 25 mm, an image side numerical aperture in the range of 0.75 up to 0.95 and a monochromatic correction of the wavefront of rms<15&permil; of the wavelength of the light source.


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