The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2004

Filed:

Dec. 18, 2000
Applicant:
Inventors:

Makoto Imanishi, Neyagawa, JP;

Shoriki Narita, Hirakata, JP;

Masahiko Ikeya, Neyagawa, JP;

Shinji Kanayama, Kashihara, JP;

Takaharu Mae, Hirakata, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/148 ; H01L 2/100 ;
U.S. Cl.
CPC ...
H01L 2/148 ; H01L 2/100 ;
Abstract

A bump forming apparatus which carries out a temperature control of a type different from the conventional art in forming bumps to a semiconductor wafer, and a bump formation method executed by the bump forming apparatus are provided. A bonding stage, a load and transfer device and a control device are provided. A wafer, after having bumps formed thereon, is held by the load and transfer device and arranged above the bonding stage through control by the control device, so that a temperature drop of the wafer is controlled. Accordingly, generation of troubles such as a crack because of thermal stress and the like can be prevented to even compound semiconductor wafers sensitive to a temperature change.


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