The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2004

Filed:

Jun. 04, 2003
Applicant:
Inventors:

Kazutaka Sasaki, Itami, JP;

Hirohiko Nakata, Itami, JP;

Akira Sasame, Itami, JP;

Mitsunori Kobayashi, Itami, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/314 ; H01L 2/350 ; B32B 1/504 ;
U.S. Cl.
CPC ...
H01L 2/314 ; H01L 2/350 ; B32B 1/504 ;
Abstract

A highly reliable member for a semiconductor device, in which a high melting point metallizing layer, which consists mainly of a high melting point metal such as W and/or Mo, and an intervening metal layer, which has a melting point of not greater than 1,000° C. and consists mainly of at least one selected from among Ni, Cu and Fe, are provided on an AlN substrate material in this order on the AlN substrate material, and a conductor layer consisting mainly of copper is directly bonded to the intervening metal layer without intervention of a solder material layer. A semiconductor element or the like is mounted on the member for a semiconductor device, thereby fabricating a semiconductor device. The high melting point metallizing layer is formed on an aluminum nitride substrate by post-fire or co-fire metallization.


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