The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2004

Filed:

May. 03, 2002
Applicant:
Inventors:

Jamie Sullivan, Sunnyvale, CA (US);

Ralph Johnson, Los Gatos, CA (US);

John Gibson, Sunnyvale, CA (US);

Mingguang Li, Sunnyvale, CA (US);

Eric Vella, Mt. View, CA (US);

Assignee:

KLA-Tencor Technologies, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/33 ; G11B 7/00 ; G11B 3/74 ;
U.S. Cl.
CPC ...
G02F 1/33 ; G11B 7/00 ; G11B 3/74 ;
Abstract

Systems and methods for scanning a beam of light over a specimen are provided. A system may include a pre-scan acousto-optical deflector (AOD) configured to deflect a beam of light, a second AOD configured as a traveling lens to focus the scanning beam, a relay lens, and an objective lens. The relay lens may be centered on the scan line produced by the second AOD, while the objective lens may be substantially de-centered with respect to the relay lens to produce a telecentric scanning spot with no field tilt. The system may modulate the amplitude of the sound wave in the first AOD to compensate for attenuation in the second AOD. The system may pre-fill one chirp packet in the second AOD while another chirp packet is scanning to substantially reduce a delay between consecutive scans.


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