The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2004
Filed:
Dec. 13, 2001
Applicant:
Inventors:
Paul F. Fewster, Brighton, GB;
Norman L. Andrew, Crawley, GB;
Assignee:
PANalytical B.V., Ea Almelo, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/3207 ;
U.S. Cl.
CPC ...
G01N 2/3207 ;
Abstract
An X-ray diffractometer has an X-ray source ( ), a double pinhole collimator ( ), a sample ( ) mounted on a rotatable sample stage ( ), an analyser crystal ( ) and a detector ( ). The analyser crystal and detector are arranged to rotate together about an axis ( ) that is coaxial with the axis of rotation of the sample stage. Very few scattered X-rays ( ) reach the detector ( ). The diffractometer has particular use for routine quality control measurements.