The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2004

Filed:

Apr. 26, 2002
Applicant:
Inventors:

Chein-Fang Lin, Pingtung, TW;

Jeng-Yann Tsay, Tainan, TW;

Chih-Pen Yen, Kaohusiung, TW;

Yong-Mao Hsu, Tainan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 1/22 ; G01H 1/100 ;
U.S. Cl.
CPC ...
G01M 1/22 ; G01H 1/100 ;
Abstract

Detecting blade vibration via ultrasonic waves is disclosed. The blade may be part of a robot that is used in conjunction with semiconductor device fabrication. A process chamber is provided that has a sidewall and a base defining a cavity contained therein. A rotatable blade is mounted at a center of the cavity that has a base portion and a tip portion extensible from the center to the sidewall of the process chamber. One or more ultrasonic sensors are mounted on the base adjacent to the sidewall. Ultrasonic waves are sent and received toward and reflected by the tip portion of the wafer blade to determine the tip portion's position. In this way, vibrational movement of the blade can be detected.


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