The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2004
Filed:
Sep. 20, 2001
Applicant:
Inventors:
Leah M. Miller, Fremont, CA (US);
Anand Govind, Fremont, CA (US);
Assignee:
LSI Logic Corporation, Milpitas, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/900 ; G01R 3/128 ;
U.S. Cl.
CPC ...
G06F 1/900 ; G01R 3/128 ;
Abstract
The present invention provides a method for reliability testing leakage characteristics in an electronic circuit, and a testing device for accomplishing the same. In an advantageous embodiment, the method includes dividing conductors of an electronic circuit into at least first and second noninterleaved regions having at least two conductors each. The method further includes forming conductor nets by electrically connecting ones of the at least two conductors of the first region to ones of the at least two conductors of the second region then testing for electrical leakage in the conductor nets.