The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2004

Filed:

Jun. 05, 2002
Applicant:
Inventors:

Joerg Butschke, Stuttgart, DE;

Albrecht Ehrmann, Krailling, DE;

Ernst Haugeneder, Vienna, AT;

Florian Letzkus, Tuebingen, DE;

Reinhard Springer, Sulz, DE;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1302 ; H01L 3/10232 ;
U.S. Cl.
CPC ...
H01L 2/1302 ; H01L 3/10232 ;
Abstract

The membrane mask is based on an SOI substrate. In an existing or subsequently produced multilayer semiconductor/insulator/semiconductor-carrier-layer substrate, the inhomogeneous mechanical stresses in the semiconductor layer, which lead to undesirable distortions, are converted at least partly into a homogenous state prior to the structuring of the semiconductor layer. In order to accomplish this, either an additional layer structure is provided on an existing SOI substrate, or a modified layer structure is provided in the fabrication of the SOI substrate, or both.


Find Patent Forward Citations

Butschke, Joerg. (2004). Method for fabricating positionally exact surface-wide membrane masks (U.S. Patent No. 6696371). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6696371

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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