The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2004

Filed:

Sep. 21, 2000
Applicant:
Inventors:

Simon Chooi, Singapore, SG;

Yi Xu, Singapore, SG;

Mei Sheng Zhou, Singapore, SG;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/348 ; H01L 2/352 ;
U.S. Cl.
CPC ...
H01L 2/348 ; H01L 2/352 ;
Abstract

A damascene structure with reduced capacitance dielectric stacking comprise a passivation, a first dielectric, an etch stop, a second dielectric and a cap layer over a first conductive layer formed on a semiconductor. The passivation, the etch stop, and the cap layers comprise low dielectric constant materials carbon nitride, boron nitride, or boron carbon nitride. The stack is patterned to form a via opening to the first conductive layer. A trench opening is formed stopping on the etch stop layer. A barrier layer of TaN, WN, TaSiN or Ta and a second conductive material is applied to the openings. Passivation, etch stop, or cap layers can be formed with carbon nitride by magnetron sputtering from a graphite target in a nitrogen atmosphere; boron carbon nitride by magnetron sputtering from a graphite target in a nitrogen and B H atmosphere; or boron nitride by PECVD using B H , ammonia, and nitrogen.


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