The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2004
Filed:
Nov. 13, 2000
John J. Pickerd, Hillsboro, OR (US);
Scott A. Davidson, Hillsboro, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A frequency domain analysis system incorporated into time domain measurement instrument has duration and resolution controls that respectively adjust the acquisition time intervals of a waveform record in seconds and adjusts the number of digital data samples over a specified duration. The duration of the acquisition waveform may be controlled using the duration control adjustment, a sample rate adjustment and a record length adjustment. The resolution controls concurrently adjusts the sample rate and the record length of the acquisition waveform while maintaining the duration constant. A movable and variable length frequency spectrum gate is applied to the digital data samples of the acquired waveform. A window filter is applied to the digital data samples within the gated region a spectrum analysis generator generates frequency domain values over the gates waveform record. The spectrum analysis generator outputs frequency domain values defined by frequency span and center frequency controls associated with spectrum analysis generator.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile