The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2003

Filed:

Sep. 24, 2002
Applicant:
Inventor:

Nobuo Matsuki, Tama, JP;

Assignee:

ASM Japan K.K., Tama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/358 ; H01L 2/131 ;
U.S. Cl.
CPC ...
H01L 2/358 ; H01L 2/131 ;
Abstract

A siloxan polymer insulation film has a dielectric constant of 3.3 or lower and has —SiR O— repeating structural units. The siloxan polymer has dielectric constant, high thermal stability and high humidity-resistance on a semiconductor substrate. The siloxan polymer is formed by directly vaporizing a silicon-containing hydrocarbon compound expressed by the general formula Si O C H (&agr;, &bgr;, x, and y are integers) and then introducing the vaporized compound to the reaction chamber of the plasma CVD apparatus. The residence time of the source gas is lengthened by reducing the total flow of the reaction gas, in such a way as to form a siloxan polymer film having a micropore porous structure with low dielectric constant.


Find Patent Forward Citations

Matsuki, Nobuo. (2003). Silicone polymer insulation film on semiconductor substrate (U.S. Patent No. 6653719). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6653719

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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