The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2003

Filed:

Dec. 21, 2001
Applicant:
Inventors:

Pang-Yen Tsai, Kaohsiung, TW;

Tien-Chen Hu, Pingtung, TW;

Sen-Shan Yang, Tainan, TW;

Wei-Cheng Ku, Tainan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/1302 ; C23F 1/00 ;
U.S. Cl.
CPC ...
H01L 2/1302 ; C23F 1/00 ;
Abstract

A method and an apparatus for removing coating layers from the top of alignment marks on a wafer situated in a spin processor are described. The method may be carried out by first providing a spin process equipped with a rotatable wafer pedestal, then providing a wafer that has at least one alignment mark covered by a coating layer, mounting an edge ring on an outer periphery of the wafer pedestal, the edge ring has at least one tab section extending outwardly from an inner periphery of the edge ring, then positioning the wafer faced down and supported by an inert gas flow on the edge ring such that a narrow gap is formed between the tab section on the edge ring and the alignment marks and dispensing an etchant onto a backside of the wafer while rotating.


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