The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2003

Filed:

Dec. 30, 1999
Applicant:
Inventors:

Luciano Mule'Stagno, St. Louis, MO (US);

Robert J. Falster, London, GB;

Assignee:

MEMC Electronic Materials, Inc., St. Peters, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 2/906 ;
U.S. Cl.
CPC ...
C30B 2/906 ;
Abstract

A method for revealing agglomerated intrinsic point defect. The method comprising coating a sample with a metal capable of decorating agglomerated intrinsic point defects, heat-treating the coated sample to decorate any agglomerated intrinsic point defects, cooling the sample, etching the surface of the cooled sample without delineating the decorated agglomerated intrinsic point defects and etching the etched surface with a delineating etchant to reveal the decorated intrinsic point defects.


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