The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2003

Filed:

Nov. 09, 2000
Applicant:
Inventors:

Karen D. Badger, Milton, VT (US);

James J. Colelli, Jericho, VT (US);

Dean C. Humphrey, Jericho, VT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 9/00 ; B08B 1/02 ; B08B 6/00 ;
U.S. Cl.
CPC ...
G03F 9/00 ; B08B 1/02 ; B08B 6/00 ;
Abstract

A method and system for reducing particulate contamination of a photomask used in lithographic printing. A reticle assembly comprises a pellicle frame and membrane which is adhered to a reticle and encloses an air space over a photomask of the reticle. Particulate matter which can adversely affect a lithographic printing result can be present within the enclosed air space. According to the invention, an interior wall of the pellicle frame is provided with an adhesive surface, and the reticle assembly is subjected to a dislodging motion to dislodge the particulate matter on the photomask surface and cause it to be directed toward the adhesive surface of the interior wall and adhere thereto, removing this particular matter from the focal plane of the lithographic optics.


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