The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2003
Filed:
Oct. 06, 1999
Method monitoring a quality of electronic circuits and its manufacturing condition and system for it
Hirohito Okuda, Yokohama, JP;
Toshifumi Honda, Yokohama, JP;
Hisae Yamamura, Yokohama, JP;
Yuji Takagi, Yokohama, JP;
Hideaki Doi, Yokohama, JP;
Shigeshi Yoshinaga, Ebina, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
With a view to providing a monitoring system for the quality and manufacturing conditions of electronic circuits capable of facilitating the grasping of correlation's between diverse manufacturing conditions and manufacturing states, statistically characteristic images are selected out of a group of images retrieved from a detection information database by specifying at least one out of the values of feature quantities, design information and manufacturing conditions, and are displayed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile