The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2003
Filed:
Aug. 31, 2001
Stefan Rusu, Sunnyvale, CA (US);
Harry Muljono, Union City, CA (US);
Gary L. Woods, Sunnyvale, CA (US);
Jeremy A. Rowlette, Palo Alto, CA (US);
Dean J. Grannes, Fremont, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Time-correlated photon counting is used to measure integrated circuit (IC) performance related to signal jitter (such as clock jitter) in a manner that is non-invasive to the circuit or node of interest. The signal jitter is measured by counting photon emissions at various nodes of interest across a controlled collapse chip connect (C4) mounted die, without interfering with the normal operation of the circuit of interest. This increases the precision and accuracy of the measurement of signal jitter significantly, since small amounts of phase noise on a particular clock signal edge can be detected. The emitted photons can be detected and subsequently correlated to a precise time base to obtain a statistical spread of switching events in time. The range of the photon distribution can be used to reliably determine safe and reasonable timing guard bands for clock and data paths in an IC.