The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2003

Filed:

Sep. 12, 2002
Applicant:
Inventors:

Hung-Yu Chiu, Kaohsiung, TW;

Ming-Shang Chen, Hsinchu, TW;

Uway Tseng, Taichung, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/1336 ;
U.S. Cl.
CPC ...
H01L 2/1336 ;
Abstract

The invention provides a method for forming a semiconductor gate, by forming spacers to isolate the interface between the HDP dielectric layer and the polysilicon gate being exposed, thereby preventing single bit failure resulting from defects at the interface between the HDP dielectric layer and the polysilicon gate. After a cap layer is formed on a conductive structure over the substrate, a HDP dielectric layer is formed exposing the cap layer. A top of the HDP dielectric layer is higher than a top of the first conductive layer. After removing the cap layer to form a recess between the HDP dielectric layer and on the conductive structure, spacers are formed on sidewalls of the recess. Afterwards, a conductive layer is formed and connected to the conductive structure.


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