The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2003

Filed:

Jun. 29, 2000
Applicant:
Inventors:

Jason C. Stinson, Mountain View, CA (US);

Erik A. De La Iglesia, Mountain View, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

An apparatus includes a test circuit, a first counter and a second counter. The test circuit is fabricated on a semiconductor substrate to generate an oscillating signal. The oscillating signal has a frequency that is dependent on at least in part a parameter of a process used to fabricate the test circuit. The first counter measures a time interval, and the second counter is coupled to the first counter to count a number of periods of the oscillating signal during the time interval.


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