The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2003

Filed:

Jul. 12, 2001
Applicant:
Inventors:

Raymond S. Bregante, San Rafael, CA (US);

Tony Shaffer, Alameda, CA (US);

K. Scott Mellen, Central Square, NY (US);

Richard J. Ross, Moraga, CA (US);

Assignee:

RJR Polymers, Inc., Oakland, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/144 ; H01L 2/130 ;
U.S. Cl.
CPC ...
H01L 2/144 ; H01L 2/130 ;
Abstract

Semiconductor circuit devices (dies) are incorporated into moisture-impenetrable electronic packages by forming enclosures around the die in three separate parts—base, sidewalls, and lid. The die is first soldered or otherwise bonded to the base, followed by attachment of the sidewalls to the base, and finally the lid to the sidewalls. For procedures involving a heat-conductive base and a high soldering temperature, the die can be secured to the base at the high soldering temperature, followed by application of the sidewalls to the base at a significantly lower temperature, avoiding potential high-temperature damage to the sidewalls. Plastic sidewalls which would otherwise deteriorate or become distorted upon exposure to the high soldering temperature can thus be used. For electronic packages in general, the use of plastic sidewalls allows the use of combinations of materials for the lid and base that are otherwise incompatible, and reduces or eliminates the incidence of failure due to stress fractures that occur during the high temperatures encountered in fabrication, assembly, testing, or use of the package.


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