The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2003

Filed:

Mar. 19, 2001
Applicant:
Inventors:

Gregory G. Freeman, Hopewell Junction, NY (US);

Basanth Jagannathan, Stormville, NY (US);

Shwu-Jen Jeng, Wappingers Falls, NY (US);

Jeffrey B. Johnson, Essex Junction, VT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1331 ; H01L 2/18222 ;
U.S. Cl.
CPC ...
H01L 2/1331 ; H01L 2/18222 ;
Abstract

The present invention provides a unique device structure and method that provides increased transistor performance in integrated bipolar circuit devices. The preferred embodiment of the present invention provides improved high speed performance with a stepped collector dopant profile that reduces emitter-collector transit time and parasitic resistance with minimal increase in parasitic capacitances. The preferred stepped collector dopant profile includes a shallow implant and a deeper implant. The shallow implant reduces the base-collector space-charge region width, reduce resistance, and tailors the collector-base breakdown characteristics. The deeper implant links the buried collector to the subcollector and provides a low resistance path to the subcollector. The stepped collector dopant profile has minimal impact on the collector-base capacitance outside the intrinsic region of the device since the higher dopant is compensated by, or buried in, the extrinsic base dopants outside the intrinsic region.


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