The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2002
Filed:
May. 01, 2000
Te Tsung Chao, Kaohsiung, TW;
Hui Chin Fang, Kaohsiung, TW;
Advanced Semiconductor Engineering, Inc., Kaoshiung, TW;
Abstract
A method of automatic identifying and skipping defective work pieces mainly utilizes a reject eye formed inside the die covering area on a substrate to automatically determine whether the skipping procedure is triggered or not. The method of the present invention comprises the steps of: finding and aligning the die eye of the die as well as the lead eye of the substrate; finding the reject eye when the die eye and the lead eye is evaluated as not being present; stopping the wire bonding operation and skipping to next work piece when the reject eye is located. The method of present invention is capable of automatically determining whether the skipping procedure is triggered or not thereby reducing operating down time and increasing throughput.