The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2002
Filed:
Sep. 29, 1999
Applicant:
Inventors:
Sudipta Bhawmik, Monmouth Junction, NJ (US);
Kwang-Ting Cheng, Santa Barbara, CA (US);
Huan-Chih Tsai, Sunnyvale, CA (US);
Assignee:
Agere Systems Guardian Corp., Orlando, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract
An almost full-scan method and system for detecting faults in circuits can achieve higher fault coverages and significantly shorter test application time as compared with full-scan techniques. A special flip-flop selection of strategy is further described which permits implementation of the almost full-scan BIST method and system.
Bhawmik, Sudipta. (2002). Almost full-scan bist method and system having higher fault coverage and shorter test application time (U.S. Patent No. 6463561). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6463561
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile