The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2002

Filed:

Apr. 25, 2000
Applicant:
Inventors:

Thomas P. Glenn, Gilbert, AZ (US);

Steven Webster, Chandler, AZ (US);

Gary L. Swiss, Gilbert, AZ (US);

Assignee:

Amkor Technology, Inc., Chandler, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/3544 ;
U.S. Cl.
CPC ...
H01L 2/3544 ;
Abstract

A structure includes a substrate such as a wafer or an array of packages. The substrate has a front-side surface and a back-side surface. A reference feature such as a scribe grid is on the front-side surface. In at least one alignment mark is on the back-side surface, the alignment mark having a precise positional relationship to the reference feature on the front-side surface. The reference mark is used to cut the substrate from the back-side surface.


Find Patent Forward Citations

Glenn, Thomas. (2002). Precision aligned and marked structure (U.S. Patent No. 6441504). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6441504

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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