The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2002

Filed:

Jul. 02, 1999
Applicant:
Inventors:

Simon Chooi, Singapore, SG;

Mei Sheng Zhou, Singapore, SG;

Yi Xu, Singapore, SG;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/144 ;
U.S. Cl.
CPC ...
H01L 2/144 ;
Abstract

Novel low dielectric constant materials for use as dielectric in the dual damascene process are provided. A low dielectric constant material dielectric layer is formed by reacting a nitrogen-containing precursor and a substituted organosilane in a plasma-enhanced chemical deposition chamber. Also, novel low dielectric constant materials for use as a passivation or etch stop layer in the dual damascene process are provided. A carbon-doped silicon nitride passivation or etch stop layer having a low dielectric constraint is formed by reacting a substituted ammonia precursor and a substituted organosilane in a plasma-enhanced chemical deposition chamber. Alternatively, a silicon-carbide passivation or etch stop layer having a low dielectric constant is formed by reacting a substituted organosilane in a plasma-enhanced chemical deposition chamber. Also, an integrated process of forming passivation, dielectric, and etch stop layers for use in the dual damascene process is described.


Find Patent Forward Citations

Chooi, Simon. (2002). Low dielectric constant materials for copper damascene (U.S. Patent No. 6436824). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6436824

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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