The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2002

Filed:

Jul. 21, 1999
Applicant:
Inventors:

Philip Eric Jackson, Plainsboro, NJ (US);

Mario Garza, San Jose, CA (US);

Christopher Neville, Sunnyvale, CA (US);

Assignee:

LSI Logic Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/20 ; G03F 1/16 ; G03F 1/00 ; G03F 9/00 ; H01L 2/1027 ;
U.S. Cl.
CPC ...
G03F 7/20 ; G03F 1/16 ; G03F 1/00 ; G03F 9/00 ; H01L 2/1027 ;
Abstract

Disclosed is a pupil aperture, and method for making the pupil aperture for use in a photolithography scanner system. The pupil aperture includes a plate having a set of pole apertures that are radially offset from a reference center point of the plate. The plate further includes a horizontal reference line that intersects the reference center point. The horizontal reference line is used to define a target angle that is between about 15 degrees and about 35 degrees from the horizontal reference line. The target angle defines an off-axis location for each of the set of pole apertures. In a specific aspect of this invention, a set ranging between 3 to 9 pole apertures can be defined in the plate, and their offset from the center point can be selected to be between about 0.3 inches and about 0.9 inches.


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