The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2002

Filed:

Jun. 30, 1998
Applicant:
Inventors:

Narendra V. Shenoy, Milpitas, CA (US);

Hi-Keung Ma, Fremont, CA (US);

Mahesh A. Iyer, Sunnyvale, CA (US);

Robert F. Damiano, Lake Oswego, OR (US);

Kevin M. Harer, Beaverton, OR (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ; G06F 9/45 ;
U.S. Cl.
CPC ...
G06F 1/750 ; G06F 9/45 ;
Abstract

A process for synthesis and rough placement of an IC design. Initially, a synthesis tool is used to generate a netlist according to HDL, user constraint, and technology data. Each of the wires of the netlist is initially assigned a unit weight. Thereupon, a cell separation process assigns (x,y) locations to each of the cells based on the weights. The wires are then examined to determine their respective performance characteristics. The wires are iteratively re-weighted, and the cells moved according to the new weightings. Next, the cell location information is supplied to the synthesis tool, which can then make changes to the netlist thereto. In the present invention, the size of each of the gates can be either scaled up or down accordingly. Again, the nets are iteratively examined and their weights are adjusted appropriately. The cells are spaced apart according to the new weights.


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