The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2002

Filed:

May. 22, 1995
Applicant:
Inventor:

Soon Ee Neoh, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05C 1/102 ;
U.S. Cl.
CPC ...
B05C 1/102 ;
Abstract

An improved shield for preventing the contamination of a wafer back from resist is combined with process steps that further prevent this contamination. The shield is located where vortex like air currents could otherwise deposit the resist vapor on the wafer back. The shield has the general shape of a cylinder that is open at the top and closed at the bottom. The bottom provides an attachment to a conventional part of the wafer coater and also forms part of the shield. The sides are arranged to extend close to the wafer back at a radius just less than the radius of the wafer. In the improved process, the spindle of the wafer chuck is not rotated at more than 1200 revolutions per minute in any of the wafer spinning operations, and the conventional step of washing the wafer back with a solvent is performed only at the end of the other operations.


Find Patent Forward Citations

Neoh, Soon. (2002). Shield for wafer station (U.S. Patent No. 6395086). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6395086

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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